ZEISS FIB-SEM 540 Crossbeam


 

Cryo-Field Emission SEM equipped with Ga+++ FIB and STEM for accurate analysis of surface structures and high-end 3D reconstruction of ultrastructures with in lens-, chamber- + energy selective detectors and STEM holder with Atlas 3D software for 16 Bit image series acquisition with up to 40.000 x 50.000 pixel resolution.

Quorum PP3010T-Cryo chamber with integrated Q150T-Es high-end sputter coater for preparation of frozen scanning electron microscopic specimens.

For any questions contact Mike Hasenberg 0201-723 4387